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Microbeam instruments, high-flux sources, new data analysis software, and database mining techniques have opened up new areas of application. Strain analysis is now more automated, and you don’t have to be a specialist to understand the results. X-ray tomography and X-ray holography are still in their infancy but show great promise.

Computer modeling and data analysis are now accessible to a wider range of researchers; this can speed up product development cycles. New instruments can perform in situ analysis, synchrotron sources are in high demand, and microbeam techniques provide spot analyses and composition maps. Nondestructive testing has come a long way: One diffractometer has a robotic arm that can pick up and rotate silicon wafers, soda cans, and metal springs with equal ease. An X-ray fluorescence instrument used for authenticating art objects has a special sample holder that can accommodate a full-sized oil painting.

This year’s conference featured the organizational meeting for the International X-ray Analysis Society (IXAS), a new organization for researchers who perform materials analysis using X-ray, neutron, and electron techniques. This completely online organization has scheduled the launch of its fully functioning Web site for October 1, 2000. The refereed online Journal of X-Ray Analysis, which the IXAS will launch in 2001, will be listed in Chemical Abstracts. Member services include moderated bulletin boards, a job clearinghouse, a news letter, workshops, an ask-the-experts forum, and online conferences. The organization is fully funded by corporate and nonprofit sponsors. The free membership and online venue are intended to attract members from around the world.

Nancy K. McGuire is associate editor of Chemical Innovation.